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  • 1
    Book
    Book
    Berkeley, Calif. : Creative Arts Book Company
    Pages: 283 S , Ill
    ISBN: 0887392725
    Language: English
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  • 2
    Online Resource
    Online Resource
    Cham : Springer International Publishing | Cham : Springer International Publishing AG
    Pages: 1 Online-Ressource (IX, 192 Seiten) , 71 illus., 50 illus. in color.
    Edition: 1st ed. 2017
    ISBN: 9783319514079 , 3319514075 , 9783319514055
    Series Statement: Electronic Materials: Science & Technology
    Parallel Title: Erscheint auch als Electro-Chemo-Mechanics of Solids
    Language: English
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  • 3
    Online Resource
    Online Resource
    Cham : Springer International Publishing | Imprint: Springer
    Pages: 1 Online-Ressource (VII, 192 p. 71 illus., 50 illus. in color)
    ISBN: 9783319514079 , 9783319514055
    Series Statement: Electronic Materials: Science & Technology
    Parallel Title: Druckausg.
    Language: English
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  • 4
    Online Resource
    Online Resource
    Cham : Springer
    Pages: Online-Ressource (VII, 192 p. 71 illus., 50 illus. in color, online resource)
    ISBN: 9783319514079 , 9783319514055
    Series Statement: Electronic Materials: Science & Technology
    Description / Table of Contents: This book brings together a collection of chapters that focus on the relationship among electrical, chemical, and mechanical properties and the study of adjusting one property through the control of another, namely, Electro-Chemo-Mechanics (ECM). The authors examine how this relationship can result in beneficial properties, such as mixed ionic and electronic conductivity, in oxides, upon oxygen deficiency or lithium insertion (electro-chemo) and/or changes in ionic and electronic mobility observed in strained systems (electro-mechano). They also consider how ECM interactions can be responsible for large stresses from non-stoichiometry induced lattice dilation (chemo-mechano). While many volumes are available devoted to the study of the origins and characteristics of electro-chemical relationships, they form the well-known field of electrochemistry, this volume is highly novel in its examination of the corresponding electro-mechanical, chemo-mechanical, and electro-chemo-mechanical relationships. The book is ideal for researchers and design engineers interested in energy storage and conversion and the electrical and mechanical properties of materials
    Description / Table of Contents: Introduction -- Conventional Methods for Measurements of Chemo-Mechanical Coupling -- In-situ High-Temperature X-ray Diffraction of Thin Films: Chemical Expansion and Kinetics -- In-situ Neutron Diffraction Experiments -- In situ Wafer Curvature Relaxation Measurements to Determine Surface Exchange Coefficients and Thermo-Chemically Induced Stresses -- Exploring electro-Chemo-Mechanical Phenomena on the Nanoscale Using Scanning Probe Microscopy -- Continuum Level Transport and Electro-Chemo-Mechanics Coupling-Solid Oxide Fuel Cells and Lithium Ion Batteries
    Parallel Title: Druckausg.
    Parallel Title: Printed edition
    Language: English
    URL: Volltext  (Lizenzpflichtig)
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  • 5
    Online Resource
    Online Resource
    Cham : Springer International Publishing
    Pages: 1 Online-Ressource (195 pages)
    ISBN: 9783319514079 , 9783319514055
    Series Statement: Electronic Materials: Science & Technology
    Description / Table of Contents: Preface -- Contents -- 1 Introduction -- References -- 2 Conventional Methods for Measurements of Chemo-Mechanical Coupling -- 2.1 Methods for Measuring Oxygen Content and Analysis of the Defect Structure of Oxide Materials -- 2.1.1 TG Analysis (with Examples) -- 2.1.2 Coulometric Titration in Solid State Electrolyte Cell (with Examples) -- 2.1.3 Determination of the Absolute Value of Oxygen Nonstoichiometry -- 2.1.3.1 Direct Reduction of Oxide Sample by Hydrogen -- 2.1.3.2 Iodometric Determination of the Absolute Oxygen Nonstoichiometry -- 2.1.4 Some Examples of the Study of Oxygen Nonstoichiometry by TG and Coulometric Titration Methods -- 2.2 Analysis of the Oxide Defect Structure Using Data on Oxygen Content -- 2.2.1 Doped Lanthanum Chromites {{\bf La}}_{{ 1{-}x}} {{\bf Me}}_{x} {{\bf Cr}}_{{ 1{-}y{-}z}} {{\bf Al}}_{z} \left( {{{\bf Mg}}} \right)_{y} {{\bf O}}_{ 3- \delta } \left( {{{\bf Me}} = {{\bf Ca}}, \, {{\bf Sr}}} \right) -- 2.2.2 Perovskite Structured Oxides {{\bf La}}_{{ 1- {\varvec y}}} {{\bf Sr}}_{{\varvec y}} {{\bf B}}_{{ 1{-}{\varvec x}}} {{\bf B}}_{{\varvec x}}^{{{\bf /}}} {{\bf O}}_{{{{\bf 3 - }}{\varvec \delta}}} \left( {{{\bf B}}{{\bf = }}{{\bf Mn}}, \, {{\bf Fe}}, \, {{\bf Co}}, \, {{\bf and}} \, {{\bf Ni}} -- \, {{\bf B}}^{{{\bf /}}} {{\bf = }}{{\bf Other}}\,{{\bf 3d{-}}}{{\bf Metal}}} \right) -- 2.3 Methods for Measuring Thermal and Chemical Expansion of Oxide Materials -- 2.3.1 Dilatometric Measurements in Air -- 2.3.2 Dilatometric Measurements in Gas Atmosphere with Controlled Oxygen Partial Pressure -- 2.4 Application of the Oxide Defect Structure for the Chemical Expansion Estimation
    Description / Table of Contents: 2.4.1 Doped Lanthanum Chromites {{\bf La}}_{{{{\bf 1}}{\rm - }{\varvec x}}} {{\bf Me}}_{{\varvec x}} {{\bf Cr}}_{{{{\bf 1 - }}{\varvec y}{{\bf - }}{\varvec z}}} {{\bf Al}}_{{\varvec z}} {{\bf Mg}}_{{\varvec y}} {{\bf O}}_{{{{\bf 3 - }}{\varvec \delta}}} \left( {{{\bf Me = Ca}},{{\bf Sr}}} \right) -- 2.4.2 Perovskite Structured Oxides {{\bf La}}_{{ 1- {\varvec y}}} {{\bf Sr}}_{{\varvec y}} {{\bf B}}_{{ 1- {\varvec x}}} {{\bf B}}_{{\varvec x}}^{{{\bf /}}} {{\bf O}}_{{{{\bf 3 - }}\delta }} \left( {{{\bf B}}{{\bf = }}{{\bf Mn}}, \, {{\bf Fe}}, \, {{\bf and}} \, {{\bf Co}} -- \, {{\bf B}}^{{{\bf /}}} {{\bf = }} {{\bf 3d}}{{\bf -}}{{\bf Metal}}} \right) -- 2.5 Summary -- References -- 3 In Situ High-Temperature X-ray Diffraction of Thin Films: Chemical Expansion and Kinetics -- 3.1 Introduction -- 3.1.1 Sources of Strain in Thin Films -- 3.2 In Situ XRD of Chemical Expansion in Polycrystalline and Epitaxial Films -- 3.3 Experimental Methods for In Situ High-Temperature XRD -- 3.3.1 Measuring Methodology for Thin Films -- 3.4 Time-Resolved XRD Measurements: Oxygen Surface Exchange Rate Determination -- 3.5 Oxygen Surface Exchange Modified by Voltage Bias -- 3.5.1 Kinetics -- 3.6 In Situ XRD of Chemical Expansion in Multi-layered Heterostructures -- 3.7 XRD Observation of Anisotropic Chemical Expansion in Layered Oxide Compounds -- 3.8 Summary -- Acknowledgements -- References -- 4 In-Situ Neutron Diffraction Experiments -- 4.1 General Introduction -- 4.1.1 Powder Diffraction Principles -- 4.1.2 Powder Diffraction from 'Real' Materials -- 4.1.3 Data Analysis -- 4.1.4 Neutrons and X-Rays -- 4.1.5 Energy Materials -- 4.2 In-Situ Neutron Powder Diffraction -- 4.2.1 Neutron Sources -- 4.2.2 Neutron Powder Diffractometers -- 4.2.3 In-Situ Studies -- 4.3 In-Situ Studies of Battery Materials -- 4.3.1 LixMn2O4 Cathode Material
    Description / Table of Contents: 4.3.2 LixNiO2, LixCoO2 and LiMnO2 Cathode Materials -- 4.3.3 LiFePO4 Cathode Materials -- 4.3.4 Anode Materials for Lithium Batteries -- 4.3.5 Other Battery Types -- 4.4 In-Situ Studies of Fuel Cell Materials -- 4.4.1 Electrolytes for SOFCs -- 4.4.2 Electrodes for SOFCs -- 4.4.3 Proton Conductors -- 4.4.4 In-Situ Conductivity Measurements -- 4.5 Summary and Future Prospects -- References -- 5 In Situ Wafer Curvature Relaxation Measurements to Determine Surface Exchange Coefficients and Thermo-chemically Induced Stresses -- 5.1 Introduction -- 5.2 Technique Overview -- 5.3 Extracting Film Stress from Bilayer Wafer Curvature -- 5.4 Extracting Oxygen Surface Exchange Coefficients from Bilayer Wafer Curvature Relaxation -- 5.5 Curvature Measurement with a Multi-Beam Optical Sensor -- 5.6 High Temperature, Controlled Atmosphere Curvature Measurements -- 5.7 System Costs -- 5.8 Comparisons to Other Oxygen Surface Exchange Coefficient Measurement Techniques -- 5.9 Limitations and Sample Requirements of the Curvature Relaxation Technique -- 5.10 Conclusions -- Acknowledgements -- Appendix 1: Sample Film Stress and Bilayer Curvature MATLAB Code -- Appendix 2: Relating Normalized Oxygen Concentration and Film Strain Changes -- References -- 6 Exploring Electro-Chemo-Mechanical Phenomena on the Nanoscale Using Scanning Probe Microscopy -- 6.1 Introduction -- 6.2 A Novel Approach to Probing Reactions on the Nanoscale: Electrochemical Strain Microscopy -- 6.2.1 Dynamic Electrochemical Strain Microscopy of Oxygen Evolution/Reduction Reactions -- 6.2.2 Dynamic ESM: Differentiating Thermodynamics and Kinetics Controlled Processes on the Nanoscale -- 6.2.3 Spatially Resolved Mapping of Electrochemical Activity and Reactivity Mapping Near a Triple Phase Boundary -- 6.2.4 Probing Surface and Bulk Electrochemical Processes on LaAlO3-SrTiO3 Surface
    Description / Table of Contents: 6.2.4.1 Time Dependent Electrochemical Strain Spectroscopy of LAO-STO -- 6.2.4.2 Analysis of Electrochemical Processes in LAO-STO System -- 6.2.5 Irreversible Electrochemical Processes in Perovskites -- 6.3 Mechanical Writing in Oxides Systems and Its Origins -- 6.3.1 Ionically Mediated Electromechanical Phenomena in Oxides -- 6.3.2 Piezochemical Phenomena in Oxides -- 6.4 Conclusions and Outlook -- References -- 7 Continuum Level Transport and Electro-Chemo-Mechanics Coupling-Solid Oxide Fuel Cells and Lithium Ion Batteries -- 7.1 Introduction -- 7.2 Continuum Modelling in Electrochemistry -- 7.2.1 Continuum Hypothesis -- 7.2.2 Poisson-Nernst-Planck (PNP) Equations -- 7.2.3 Kinetics at the Boundary -- 7.2.3.1 Charge Transfer Reactions -- 7.2.3.2 Space Charge Region at the Boundary -- 7.3 Continuum Level Transport for ECM Coupling -- 7.3.1 Addition of Stress-Dependent Component to the Chemical Potential -- 7.3.2 Kinematics and Solid Mechanics of Chemical Induced-Deformation -- 7.3.2.1 Kinematics -- 7.3.2.2 Mechanical Equilibrium -- 7.4 Applications -- 7.4.1 Continuum Modelling for Electrode Materials for LIBs -- 7.4.1.1 Single-Particle Model -- 7.4.1.2 Macrohomogeneous Electrode Models -- 7.4.2 Continuum Modelling for Oxides for SOFC -- 7.5 Conclusion -- References -- Index
    Parallel Title: Print version Bishop, Sean R Electro-Chemo-Mechanics of Solids
    Language: English
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  • 6
    Book
    Book
    Cham : Springer
    Pages: vii, 192 Seiten , Illustrationen, Diagramme , 23.5 cm x 15.5 cm, 0 g
    ISBN: 3319514059 , 9783319514055 , 9783319514079
    Series Statement: Electronic Materials: Science & Technology
    Note: Literaturangaben
    Language: English
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  • 7
    E-Resource
    E-Resource
    Cham : Springer | Ann Arbor, Michigan : ProQuest
    Pages: 1 Online-Ressource (197 pages)
    ISBN: 9783319514079 , 9783319514055
    Series Statement: Electronic Materials: Science and Technology Ser.
    Note: Description based on publisher supplied metadata and other sources
    Language: English
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  • 8
    Book
    Book
    Cham : Springer
    Pages: vii, 192 Seiten , Illustrationen, Diagramme , 23.5 cm x 15.5 cm
    ISBN: 9783319514055 , 3319514059 , 9783319514079
    Series Statement: Electronic Materials: Science & Technology
    Parallel Title: Elektronische Reproduktion
    Parallel Title: Erscheint auch als
    Language: English
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  • 9
    Online Resource
    Online Resource
    Common title
    Pages: Online-Ressource , online resource.
    ISSN: 1757-7241
    In: volume:24
    In: number:1
    In: day:7
    In: month:11
    In: year:2016
    In: pages:1-10
    In: date:12.2016
    In: Scandinavian journal of trauma, resuscitation and emergency medicine, London : BioMed Central, 2008-
    Language: English
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  • 10
    Pages: X, 294 S. , Ill. , 23x15x2 cm
    ISBN: 1107000149 , 9781107000148
    Language: English
    Subjects: Philosophy
    RVK:
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