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  • 1
    Electronic Resource
    Electronic Resource
    Stamford, Conn. [u.a.] : Wiley-Blackwell
    Polymer Engineering and Science 20 (1980), S. 555-561 
    ISSN: 0032-3888
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The techniques of solid state coextrusion and powder extrusion have been employed for the deformation of ultra high molecular weight polyethylene. Chain folded and chain extended morphologies obtained under different crystallization conditions were coextruded within a nylon 11 casing acting as a processing aid at an extrusion draw ratio (EDR) of 5 at ≤ 120°C and 0.20 GPa. The powder was compacted and extruded at ≤ 128°C and 0.23 GPa up to an EDR of 24. The physical and mechanical properties of the extrudates were evaluated and found to be dependent on intial morphology. An extrudate from the chain-folded morphology gave a low modulus of 0.71 GPa, the chain-extended morphology a modulus of 6.7 GPa, and the compacted powder a modulus of 15 GPa.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Stamford, Conn. [u.a.] : Wiley-Blackwell
    Polymer Engineering and Science 26 (1986), S. 1165-1170 
    ISSN: 0032-3888
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Variation in line width caused by light scattered from the substrate (reflective notching) is a major problem in VLSI lithography. This paper demonstrates the reduction of reflective notches using a resist with increased absorptivity (a dyed resist). The optimal set of process conditions which minimize line width variations is explored.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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  • 3
    Electronic Resource
    Electronic Resource
    Hoboken, NJ : Wiley-Blackwell
    AIChE Journal 14 (1968), S. 671-673 
    ISSN: 0001-1541
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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  • 4
    Electronic Resource
    Electronic Resource
    Stamford, Conn. [u.a.] : Wiley-Blackwell
    Polymer Engineering and Science 7 (1967), S. 90-93 
    ISSN: 0032-3888
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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